A simplified but intuitive analytical model for intermittent-contact-mode force microscopy based on Hertzian mechanics
نویسندگان
چکیده
منابع مشابه
A simplified but intuitive analytical model for intermittent- contact-mode force microscopy based on Hertzian mechanics
The forces acting on the substrate in intermittent-contact-mode (IC mode, tapping mode) atomic force microscopy are not accessible to a direct measurement. For an estimation of these forces, a simple analytical model is developed by considering only the shift of the cantilever resonance frequency caused by Hertzian (contact) forces. Based on the relationship between frequency shift and tip–samp...
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ژورنال
عنوان ژورنال: Surface Science
سال: 1999
ISSN: 0039-6028
DOI: 10.1016/s0039-6028(99)00861-4